Optical Measurement Technology There are 54 products.
Beam profilers are used in laser beam analysis because it is necessary in certain cases to combine extremely high sensitivity with maximum linearity and dynamics. They make precise laser beam measurements possible. The CMOS-based WinCamD-LCM Beam Profiler system and other cameras also have C-mount connection threads and can be combined with lenses for imaging or converter optics for adaptation to other wavelengths. In addition, beam profilers and slit scanners can be used via LabView or other programming interfaces.
3D Optical NDE System
The OIS-1000, also known as the Acute Detection for Advanced Materials (ADAM™) system, is a high speed, high resolution 3D optical non-destructive evaluation (NDE) system for the inspection of advanced materials.
Tunable Laser Source
The TLS-101 is a compact tunable laser source for daily test and measurement applications.
Multimode Scrambler - SpeckleFree™
Speckle patterns from a multimode fiber can cause problems in many applications that require uniform, stable light distributions at the fiber output. The MMS-201 multimode scrambler, is specially designed to solve this problem.
High Speed Multifunction Polarization...
The MPC-203 is a special version of GPCs’ Multifunction Polarization Controller which can reach extremely high rates of polarization change. It combines PolaRite™ II/III polarization controller with proprietary polarization control algorithms to achieve a wide range of polarization control functionalities.
Polarisation Stabilizer
The polarization stabilizers maintain stable output states of polarization (SOP) against rapid input SOP fluctuations, compensating for an input polarization discontinuity in as fast as 5 ms, or tracking without resets against
Calibration lamp, Ar/Hg
Fuente de mercurio y argón. Gracias a sus definidas líneas de emisión entre 253 y 1014 nanómetros es ideal y para calibraciones, siendo además muy económica. Con salida de fibra óptica SMA